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Anales (Asociación Física Argentina)
versión impresa ISSN 0327-358Xversión On-line ISSN 1850-1168
Resumen
VIDAL, R. A et al. Growth, thermal desorption and ion bombardment damage inC60films deposited on Cu(111). An. AFA [online]. 2016, vol.27, n.2, pp.67-72. ISSN 0327-358X.
Auger Electron Spectroscopy (AES) and Low Energy Electron Diffraction (LEED) were used to characterize the growth and thermal desorption of C60 on Cu(111). C60 films were grown by sublimation from a Knudsen cell at 350°C, placed in an ultra-high vacuum chamber (UHV) (~10-9 Torr). We estimated the best conditions to obtain low energy ion scattered spectra (LEIS) by measuring the irradiation damage produced by typical doses used in theseexperiments (~1014 iones/cm2). In order to analyze the potential damage of the sample by ion bombardment (2 , 4 and 8 keV H+, He+ and Ar+), we monitored the evolution of the characteristicplasmon due to π-bonds of the C60 molecule C atoms by Electron Energy Loss Spectroscopy (EELS). In addition, Auger spectra (AES) were taken before and after irradiation to characterize and quantify the damage. Our study shows that: C60 growths on Cu(111) layer by layer; the desorption of the first monolayer is different to the desorption of the other layers, remaining the first monolayer even when the substrate is heated up to 500°C and; damage by ion bombardment, at the used dose, was only detected when the sample was under Ar+ irradiation.
Palabras clave : Thermal desorption; C60; Cu(111); Ion bombardment; AES; EELS; LEED; LEIS.